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SBIR/STTR Interactive Topic Information System (SITIS)

Posted on May 23, 2012 by John in News

Develop an affordable x-ray microscope system for use in performing integrated circuit (IC) reverse engineering via SBIR/STTR Interactive Topic Information System (SITIS). Editor’s note: An important first step in developing a comprehensive X-ray inspection program to detect counterfeit and trojan ICs.

chip, counterfeit, DMEA, IC, inspection, reverse engineering, semiconductor, trojan, x-ray

iPad maker Foxconn turns to X-ray inspections to cut defects | Apple – CNET News

Posted on March 24, 2012 by John in News

The supplier to Apple is adding inline X-ray inspection systems, in a move seen as a way to improve efficiency and reduce product defects. via iPad maker Foxconn turns to X-ray inspections to cut defects | Apple – CNET News.

apple, China, foxconn, inspection, iPad, x-ray

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