Develop an affordable x-ray microscope system for use in performing integrated circuit (IC) reverse engineering via SBIR/STTR Interactive Topic Information System (SITIS). Editor’s note: An important first step in developing a comprehensive X-ray inspection program to detect counterfeit and trojan ICs.
chip, counterfeit, DMEA, IC, inspection, reverse engineering, semiconductor, trojan, x-rayA worldwide epidemic of counterfeit electronic components is flooding the market and affects the supply chains of all industries. It is estimated that the financial loss due to counterfeit components is over $10 billion per year. Counterfeiting itself becomes profitable when scrapped components, components from recycled products or inexpensive components can be “remarked” and sold [...]
counterfeit, electronic, inspection, parts, semiconductor(c) 2012 Chip Security - Web Design by Blue Mustang
