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SBIR/STTR Interactive Topic Information System (SITIS)

Posted on May 23, 2012 by John in News

Develop an affordable x-ray microscope system for use in performing integrated circuit (IC) reverse engineering via SBIR/STTR Interactive Topic Information System (SITIS). Editor’s note: An important first step in developing a comprehensive X-ray inspection program to detect counterfeit and trojan ICs.

chip, counterfeit, DMEA, IC, inspection, reverse engineering, semiconductor, trojan, x-ray

Novel Approaches for the Detection of Counterfeit Electronic Components

Posted on April 23, 2012 by John in News

A worldwide epidemic of counterfeit electronic components is flooding the market and affects the supply chains of all industries. It is estimated that the financial loss due to counterfeit components is over $10 billion per year. Counterfeiting itself becomes profitable when scrapped components, components from recycled products or inexpensive components can be “remarked” and sold […]

counterfeit, electronic, inspection, parts, semiconductor

iPad maker Foxconn turns to X-ray inspections to cut defects | Apple – CNET News

Posted on March 24, 2012 by John in News

The supplier to Apple is adding inline X-ray inspection systems, in a move seen as a way to improve efficiency and reduce product defects. via iPad maker Foxconn turns to X-ray inspections to cut defects | Apple – CNET News.

apple, China, foxconn, inspection, iPad, x-ray

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