Chip Security
  • Email
  • Home
  • News
  • Reports
  • Opinion
  • Tools
  • About

SBIR/STTR Interactive Topic Information System (SITIS)

Posted on May 23, 2012 by John in News - No Comments

Develop an affordable x-ray microscope system for use in performing integrated circuit (IC) reverse engineering

via SBIR/STTR Interactive Topic Information System (SITIS).

Editor’s note: An important first step in developing a comprehensive X-ray inspection program to detect counterfeit and trojan ICs.

  • Share this:
  • Share
  • Digg
  • Facebook
  • Email
  • Print
chip, counterfeit, DMEA, IC, inspection, reverse engineering, semiconductor, trojan, x-ray

Leave a Reply Cancel reply

Your email address will not be published. Required fields are marked *

CAPTCHA Image
Refresh Image

*

You may use these HTML tags and attributes: <a href="" title=""> <abbr title=""> <acronym title=""> <b> <blockquote cite=""> <cite> <code> <del datetime=""> <em> <i> <q cite=""> <strike> <strong>

Enter your email address to subscribe to this blog and receive notifications of new posts by email.

Sponsored by

Cyberterrorism Techno-thriller

Recent Posts

  • Design for Security: Needed More than Ever
  • New DARPA Program Seeks to Reveal Backdoors and Other Hidden Malicious Functionality in Commercial IT Devices
  • Electrical testing to track fake military parts
  • DOD requirement to mark parts with unique DNA
  • Toshiba adds IP protection to automotive MCUs

Recent Comments

    (c) 2012 Chip Security - Web Design by Blue Mustang

    loading Cancel
    Post was not sent - check your email addresses!
    Email check failed, please try again
    Sorry, your blog cannot share posts by email.