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SBIR/STTR Interactive Topic Information System (SITIS)

Posted on May 23, 2012 by John in News - No Comments

Develop an affordable x-ray microscope system for use in performing integrated circuit (IC) reverse engineering

via SBIR/STTR Interactive Topic Information System (SITIS).

Editor’s note: An important first step in developing a comprehensive X-ray inspection program to detect counterfeit and trojan ICs.

chip, counterfeit, DMEA, IC, inspection, reverse engineering, semiconductor, trojan, x-ray

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